MAPPING THE YIELD OF SPRING DURUM WHEAT CROPS
DOI:
https://doi.org/10.51452/kazatu.2021.1(108).166Keywords:
Spring durum wheat, stages of growth and development, vegetation index, satellite images, gradation of the yield level, productivity, elementary field, sowing, yield mapping.Abstract
The results of the research showed that when conducting remote sensing of spring durum wheat crops during the seed formation period, the accuracy between the indicators of the normal relative vegetation index (NDVI) of crops and the biological yield of elementary fields reaches 92.56%, and the coefficient of variation deviation of both indicators is 3.84 units. The maximum indicator of the normal relative vegetation index during the formation of durum wheat grains was 0.79-0.81 units. The high correlation between the relative vegetation index (NDVI) and the yield (r=6.9339) proves that the created yield map during the formation of durum wheat seeds can show the actual level of yield. In the course of research, it was proved that yield fluctuations in elementary fields of spring durum wheat reach 169.6% and in predicting productivity for the next year, the yield map proves its necessity.
